Article citationsMore>>

Lewis, T.J. (2004) Interfaces Are the Dominant Feature of Dielectrics at the Nanometric Level. IEEE Transactions on Dielectrics and Electrical Insulation, 11, 739-753.
http://dx.doi.org/10.1109/TDEI.2004.1349779

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top