Article citationsMore>>

Kim, H. and Boldyreff, C. (2000) A Method to Recover Design Patterns Using Software Product Metrics. In: Proceedings of the 6th International Conference on Software Reuse: Advances in Software Reusability, Vienna, 27-29 June 2000, 318-335.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top