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Ohta, H., Kawamura, K., Orita, M., Hirano, M., Sarukura, N. and Hosono, H. (2000) Current Injection Emission from a Transparent p-n Junction Composed of p-SrCu2O2/n-ZnO. Applied Physics Letters, 77, 475-477.http://dx.doi.org/10.1063/1.127015
has been cited by the following article:
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TITLE:
Structural Analysis of ZnO Film Deposited by Means of Metal Organic Decomposition Method
AUTHORS:
Masato Ohmukai, Takuya Nakagawa, Masaru Kamano, Nobutomo Uehara
KEYWORDS:
ZnO Film, MOD Method, Transparent Electrode, X-Ray Analysis
JOURNAL NAME:
Journal of Materials Science and Chemical Engineering,
Vol.2 No.11,
November
10,
2014
ABSTRACT: ZnO films were deposited on glass substrates by means of a metal organic decomposition (MOD) method. We investigated the effect of annealing temperature, time and the number of laminated layers on the film structure on the basis of X-ray diffraction measurements. We found the optimum conditions of the temperature and the time to be 600°C and 40 minutes for the preparation, respectively. In addition, the layer-by-layer forming was not found to degrade the film from viewpoint of X-ray line width.