TITLE:
Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film
AUTHORS:
Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail
KEYWORDS:
E-Beam Deposition, Surface Morphology, Thin Films, EDX, Atomic Force Microscopy, SEM, Annealing, Electrical and Optical Properties
JOURNAL NAME:
Advances in Materials Physics and Chemistry,
Vol.4 No.10,
October
23,
2014
ABSTRACT: The following article has been retracted due to the fact that the authors practise fraud. The scientific community takes a very strong view on this matter, and the Advances in Materials Physics and Chemistry treats all unethical behavior seriously. This paper published in Vol. 4 No. 10 194-202, 2014 has been removed from this site.
Title: Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film
Authors: Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail