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Tahir, D., Kwon, H.L., Shin, H.C., Oh, S.K., Kang, H.J., Heo, S., et al. (2010) Electronic and Optical Properties of Al2O3/SiO2 Thin Films Grown on Si Substrate. Journal of Physics D: Applied Physics, 43, 255301-255400.

has been cited by the following article:

• TITLE: UV Photocatalytic Degradation of Commercial Naphthenic Acid Using TiO2-Zeolite Composites

  AUTHORS: Kennedy K. Kalebaila, Craig Fairbridge

  KEYWORDS: Naphthenic Acid Conversion, GC-MS, TAN, Diffuse Reflectance, TiO2-Zeolite

  JOURNAL NAME: Journal of Water Resource and Protection, Vol.6 No.12, September 30, 2014

  ABSTRACT: The presence of naphthenic acids in oil sand products and process streams is the cause of toxicity to aquatic life and corrosion. The removal of organic acids from tailings pond water reduces the negative impact on marine life. The ultra-violet (UV) photocatalytic reduction of commercial naphthenic acid in water using TiO2-zeolitecomposites showed a significant decrease in the concentration of naphthenic acid, accompanied by an increase in carbon dioxide formation; the presence of carbon dioxide signifies degradation of the naphthenic acids. Mixtures of the acid and photocatalyst kept in the dark did not show any concentration changes. The extent of naphthenic acid reduction by UV light was verified by the reduction in total acidity. The total acidity values of mixtures of the acid and TiO2-zeoliteexposed to UV decreased by 31% compared to mixtures kept in the dark. A reduction in total acidity may lead to a decrease in the toxicity of naphthenic acid contaminated water.