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Kempenaers, L., Janssens, K.K., Jochum, K.P., Vincze, L., Vekemans, B., Somogyi, A., Drakopoulos, M. and Adams, F. (2003) Micro-Heterogeneity Study of Trace Elements in USGS, MPI-DING and NIST Glass Reference Materials by Means of Synchrotron Micro-XRF. Journal of Analytical Atomic Spectrometry, 18, 350-357.
http://dx.doi.org/10.1039/b212196d

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