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Balzar, D. (1993) X-Ray Diffraction Line Broadening: Modeling and Applications to High-Tc Superconductors. Journal of Research of the National Institute of Standards and Technology, 98, 321.
http://dx.doi.org/10.6028/jres.098.026

has been cited by the following article:

• TITLE: 1-D Paracrystalline Model to Simulate a Bragg Reflection: Computation of Crystallite Size and Lattice Strain

  AUTHORS: M. B. Nanda Prakash, G. Thejas Urs, H. T. Ananda, R. Somashekar

  KEYWORDS: X-Ray Diffraction, Paracrystal, Simulation

  JOURNAL NAME: Crystal Structure Theory and Applications, Vol.3 No.2, June 30, 2014

  ABSTRACT: A simple and elegant method to simulate single order reflection profile based on 1-D paracrystalline model has been proposed here. For variety of polymer films this approach has been applied to compute microcrystalline parameters like crystallite size and lattice strain. Other metallic oxide compounds are also analysed using this approach. Employing this model, X-ray diffraction patterns from various polymer samples have been analysed and corresponding microstructure parameters have been reported in this article.