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French, R.H., Muèllejans, H., Jones, D.J., Duscher, G., Cannon, R.M. and Ruèhle, M. (1998) Dispersion Forces and Hamaker Constants for Intergranular Films in Silicon Nitride from Spatially Resolved-Valence Electron Energy Loss Spectrum Imaging. Acta Materialia, 46, 2271-2287.
http://dx.doi.org/10.1016/S1359-6454(98)80008-6

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