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De Caro, D., Fraxedas, J., Faulmann, C., Malfant, I., Milon, J., Lamere, J.F., Colliere, V. and Valade, L. (2004) Metallic thin films of TTF[Ni(dmit)(2)](2) by electrode-position on (001)-oriented silicon substrates. Advanced Materials, 16, 835-838.

has been cited by the following article:

• TITLE: Investigation on Third-Order Optical Nonlinearities of Two Organometallic Dmit2- Complexes Using Z-Scan Technique

  AUTHORS: He-Liang Fan, Quan Ren, Xin-Qiang Wang, Ting-Bin Li, Jing Sun, Guang-Hui Zhang, Dong Xu, Gang Yu, Zhi-Hua Sun

  KEYWORDS: Z-scan Technique; Third-order Nonlinearity; Metal-dmit Complexes; Figure of Merit.

  JOURNAL NAME: Natural Science, Vol.1 No.2, September 28, 2009

  ABSTRACT: The third-order nonlinear optical properties of two dmit organometallic complexes, [(CH3)4N] [Au(C3S5)2] (MeAu) and [(CH3)4N][Ni(C3S5)2] (Me Ni) in acetone solutions, were characterized us- ing a short pulse Z-scan technique at 1064 nm wavelength. Self-defocusing effects were found in both samples and stronger saturable absorp-tion was observed in MeNi solution comparing with that of MeAu. The origins were analyzed for the differences between the results. Two figures of merit W and T were also calculated to evalu-ate the suitability of two materials for all-optical integrated devices. The results of W=22.84 and T≈0 of MeAu make it an excellent candidate for the all-optical applications.