Article citationsMore>>

Kumaresh, S. and Ramachandran, B. (2012) Defect Prevention Based on 5 Dimensions of Defect Origin. International Journal of Software Engineering & Applications (IJSEA), 3, 87-98.
http://dx.doi.org/10.5121/ijsea.2012.3407

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top