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Reddy, M., Martin, S.C., Molnar, A.C., Muller, R.E., Smith, R.P., Siegel, P.H., Mondry, M.J., Rodwell, M.J.W., Kroemer, H. and Allen Jr., S.J. (1997) IEEE Electron Device Letters, 18, 218-221. http://dx.doi.org/10.1109/55.568771
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