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Tausch, J., Sleeter, D., Radaelli, D., et al. (2007) Neutron Induced Micro SEL Events in COTS SRAM Devices. IEEE Radiation Effects Data Workshop, Honolulu, 23-27 July 2007, 185-188.

has been cited by the following article:

• TITLE: A New Analyzing Method of Single Event Latch-Up Protection Circuit Based on Current Comparing and Its Performance Verification

  AUTHORS: Pengwei Li, Xiaoyun Fu, Lei Luo, Qingkui Yu

  KEYWORDS: SEL Protection Circuit, Power-On Time, Cut-Off Time, Adjustable Recovery Time, COTS

  JOURNAL NAME: Journal of Modern Physics, Vol.5 No.6, April 25, 2014

  ABSTRACT: Single event latch-up (SEL) is a significant issue for electronics design in space application, which would cause large currents in electronic devices, and may lead to burning out of devices. A new monitoring circuit based on current-comparing method is designed to protect the electronics away from SEL’s damage in radiation environment. The response time of protection circuit has been analyzed. The signal simulation results indicated that the operating time of the SEL protection circuit is dependent on the action time of current comparator and system application recovery time. The function of the monitoring circuit protection device away from SEL’s damage has validated through experiment at last.