Article citationsMore>>

Jeon, S.J., Oh, M., Jeon, H., Hyun, S. and Lee, H.J. (2011) Effects of Post-Annealing on Thermoelectric Properties of Bismuth-Tellurium Thin Films Deposited by Co-Sputtering. Microelectronic Engineering, 88, 541-544.
http://dx.doi.org/10.1016/j.mee.2010.06.036

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top