Article citationsMore>>

Sheik-Bahaei, M. and Van Stryland, E.W. (1998) Z-Scan Measurements of Optical Nonlinearities, Characterization Techniques and Tabulations for Organic Nonlinear Materials. In: Kuzyk, M.G. and Dirk, C.W., Eds., Marcel Dekker, Inc., 655-692.

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top