Article citationsMore>>

Fukuzawa, M., Yamada, M., Islam, M.R., Chen, J. and Sekiguchi, T. (2012) Quantitative Photoelastic Characterization of Residual Strains in Grains of Multicrystalline Silicon. Journal of Electronic Materials, 39, 700-703.
http://dx.doi.org/10.1007/s11664-010-1164-x

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top