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Fukuzawa, M., Yamada, M., Islam, M.R., Chen, J. and Sekiguchi, T. (2012) Quantitative Photoelastic Characterization of Residual Strains in Grains of Multicrystalline Silicon. Journal of Electronic Materials, 39, 700-703.
http://dx.doi.org/10.1007/s11664-010-1164-x
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