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Sobue, S., Yamauchi, T., Suzuki, H., Mukainakano, S., Takenaka, O. and Hattori, T. (1997) Dependence of Diffusion Barrier Properties in Microstructure of Reactively Sputtered TiN Films in Al Alloy/TiN/Ti/Si System. Applied Surface Science, 117-118, 308-311. http://dx.doi.org/10.1016/S0169-4332(97)80099-2

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