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S. P. Kao, C. Y. Lee, C. Y. Wang, J. D.-S. Deng, C. C. Chang and C. H. Kao, “An Analytical Extraction Method for Scalable Substrate Resistance Model in RF MOSFETs,” 2007 International Semiconductor Device Research Symposium, College Park, 12-14 December 2007, pp. 1-2.

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