Article citationsMore>>

F. Gentile, E. Battista, A. Accardo, M. L. Coluccio, M. Asande, G. Perrozziello, G. Das, C. Liberale, F. De Angelis, P. Candeloro, P. Decuzzi and E. Di Fabrizio, “Fractal Structure Can Explain the Increased Hydrophobicity of Nanoporous Silicon Films,” Microelectronic Engineering, Vol. 88, No. 8, 2011, pp. 2537-2540.
http://dx.doi.org/10.1016/j.mee.2011.01.046

has been cited by the following article:

SCIRP Newsletter
Copyright © 2006-2026 Scientific Research Publishing Inc. All Rights Reserved.
Top