TITLE:
Time-of-Flight Mass Spectrometer with Transaxial Ion Reflector
AUTHORS:
Seitkerim B. Bimurzaev, Nakhypbek U. Aldiyarov
KEYWORDS:
Time-Of-Flight (TOF) Mass Reflectron; Transaxial Electrostatic Mirror; Transaxial Ion Reflector; TOF Chromatic Aberration; Stigmatic Spatial-TOF Focusing
JOURNAL NAME:
Journal of Modern Physics,
Vol.5 No.1,
January
22,
2014
ABSTRACT: Two variants of application of a transaxial mirror with stigmatic
spatial time-of-flight focusing in the time-of-flight mass
spectrometer have been considered. In the first variant, the transaxial
mirror is used as an ion reflector in the ordinary scheme of the time-of-flight
mass reflectron. In the second variant, the transaxial mirror simultaneously fulfills
the function of the ion reflector and corrector of aberrations caused by the
energy spread of ions in the package, formed by the ion source of the mass
reflectron. The expressions defining the conditions of stigmatic spatial
time-of-flight focusing in the transaxial mirror and the combined system
consisting of an ion source and a mirror
have been derived. The relationships between geometrical and electrical
parameters of three- and four-electrode transaxial mirrors realizing these
conditions have been obtained by numerical calculations.