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J. Nishizawa, K. Suto, T. Sasaki, T. Tanabe, T. Tanno, Y. Oyama and F. Sato, “GaP Raman Terahertz High Accuracy Spectrometer and Its Application to Detect Organic and Inorganic Crystalline Defects,” Proceedings of the Japan Academy, Series B, Vol. 82, No. 9, 2006, pp. 353-358. http://dx.doi.org/10.2183/pjab.82.353

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