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G. W. Dietz, M. Schumacher, R. Waser, S. K. Streiffer, C. Basceri and A. I. Kingon, “Leakage Currents in Ba0.7Sr0.3TiO3 Thin Films for Ultrahigh-Density Dynamic Random Access Memories,” Journal of Applied Physics, Vol. 82, No. 5, 1997, pp. 2359-2364.
http://dx.doi.org/10.1063/1.366045

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