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S. H. Han and D. Levi, “Comment on “Optical Characterization of CuIn1?xGaxSe2 Alloy Thin Films by Spectroscopic Ellipsometry,” Journal of Applied Physics, Vol. 100, No. 9, 2006, pp. 096102-096103. http://dx.doi.org/10.1063/1.2374223

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