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W. G. Wang, C. Ni, G. X. Miao, C. Weiland, L. R. Shah, X. Fan, P. Parson, J. Jordan-Sweet, X. M. Kou, Y. P. Zhang, R. Stearrett, E. R. Nowak, R. Opila, J. S. Moodera and J. Q. Xiao, “Understanding Tunneling Magnetoresistance during Thermal Annealing in Mgo-Based Junctions with CoFeB Electrodes,” Physical Review B, Vol. 81, No. 14, 2010, pp. 144406. doi:10.1103/PhysRevB.81.144406

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