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O. Ozdemir, I. Atilgan, B. Akaoglu, K. Sel and B. Katircioglu, “Frequency Dependence of Conductivity in Intrinsic Amorphous Silicon Carbide Film, Assessed through Admittance Measurement of Metal Insulator Semiconductor Structure,” Thin Solid Films, Vol. 497, 2006, pp. 149-156. http://dx.doi.org/10.1016/j.tsf.2005.10.065

has been cited by the following article:

• TITLE: Conduction Mechanism Analysis of Inversion Current in MOS Tunnel Diodes

  AUTHORS: Ayşe Evrim Saatci, Orhan Özdemir, Kubilay Kutlu

  KEYWORDS: Excess Capacitance; MOS; Selfly Inverted Region; Tunneling Based Inversion Currents

  JOURNAL NAME: Materials Sciences and Applications, Vol.4 No.12, December 6, 2013

  ABSTRACT: Self inversion issue and excess capacitance phenomenon were observed for the first time in relatively thick silicon dioxide (SiO2) in the form of MOS (metal(Al)/SiO2/p type crystalline silicon) structure. Both phenomena were based on minority carriers (electrons in this case) and studied through DC current-applied bias voltage (I-V) and AC admittance measurements in dark/light condition as a function of ambient temperature (295 - 380 K). Either of the cases was the departure of traditional MOS analysis, manifesting themselves in the inversion regime of MOS diode. Increase in frequency/temperature/light intensity within dark and light conditions led to weaken the maxima of hump in C-V curves and finally turned into deep depletion mode after exceeding threshold value of frequency/temperature/light intensity. In resumed conditions, supplementary I-V measurements were carried out to describe the generation and conduction mechanism(s) for minority carriers (electrons).