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S. Lee, T. F. Lemczyk and M. M. Yovanovich, “Analysis of Thermal Vias in High Density Interconnect Technology,” Proceedings of the 8th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SE- MI-THERM), Austin, 3-5 February 1992, pp. 55-61. http://dx.doi.org/10.1109/STHERM.1992.172851

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