TITLE:
Effect of Switching on Metal-Organic Interface Adhesion Relevant to Organic Electronic Devices
AUTHORS:
Babaniyi Babatope, Akogwu Onobu, Olusegun O. Adewoye, Winston O. Soboyejo
KEYWORDS:
AFM; Interface; Adhesion Force; Organic Electronics; Voltage Switching; Organic Memory Devices; Surface Treatment
JOURNAL NAME:
Advances in Materials Physics and Chemistry,
Vol.3 No.7,
November
28,
2013
ABSTRACT: Considerable efforts
are currently being devoted to investigation of metal-organic, organic-organic
and organic-inorganic interfaces relevant to organic electronic devices such as
organic light emitting diode (OLEDs), organic photovoltaic solar cells, organic
field effect transistors (OFETs), organic spintronic devices and organic-based
Write Once Read Many times (WORM) memory devices on both rigid and flexible
substrates in laboratories around the world. The multilayer structure of these
devices makes interfaces between dissimilar materials in contact and plays a prominent
role in charge transport and injection
efficiency which inevitably affect device performance. This paper
presents results of an initial study on how switching between voltage
thresholds and chemical surface treatment affects adhesion properties of a
metal-organic (Au-PEDOT:PSS) contact interface in a WORM device. Contact and
Tapping-mode Atomic Force Microscopy (AFM) gave surface topography, phase
imaging and interface adhesion properties in addition to SEM/EDX imaging which
showed that surface treatment, switching and surface roughness all appeared to
be key factors in increasing interface adhesion with implications for increased
device performance.