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H. J. Wiesmann and H. R. Zeller, “A Fractal Model of Dielectric Breakdown and Prebreakdown in Solid Dielectrics,” Journal of Applied Physics, Vol. 60, No. 5, 1986, pp. 1770-1773. doi:10.1063/1.337219

has been cited by the following article:

• TITLE: Electrical Tree Simulation Based on the Self-Organization Criticality

  AUTHORS: H. M. Hu, Y. Yang, W. Lu, G. P. Zhao

  KEYWORDS: Fractal; Electrical Tree simulation; Self-Organization Criticality

  JOURNAL NAME: Energy and Power Engineering, Vol.5 No.4B, November 18, 2013

  ABSTRACT: So far much effort has been made to understand the development of electrical treeing. For the simulation based study of electrical treeing, the most common method is to apply DBM stochastic model to simulate the growing of electrical treeing patterns. Previous simulation results showed that this stochastic model is capable of simulating the real electrical treeing patterns in a point-to-plane electrode system. However, this model only allows the tree channels to propagate on equipotential lines proportional to local electrical field. Therefore, it is necessary to develop a novel stochastic model to simulate the electrical patterns in order to get a good agreement with experimental results.