Scanning Head for the Apertureless near Field Optical Microscope

ISSN Print: 2165-9257
ISSN Online: 2165-9273
www.scirp.net/journal/mi
E-mail: [email protected]

Citations

"Scanning Head for the Apertureless near Field Optical Microscope"
written by D. V. Kazantsev, H. Ryssel,
published by Modern Instrumentation, Vol.2 No.2, 2013

has been cited by the following article(s):

[1]	ASNOM mapping of SiC epilayer doping profile and of surface phonon polariton waveguiding
	2020

[2]	Enhancement of the Local Electromagnetic Field over Planar “Particles” Formed on the Surface of a Polar Crystal
	JETP Letters, 2018

[3]	Formation of Surface Plasmon-Polariton Vortices at Reflection from Curvilinear Boundary
	2018

[4]	Усиление локального электромагнитного поля над планарными “частицами” на поверхности полярного кристалла
	2018

[5]	Безапертурная микроскопия ближнего оптического поля
	2017

[6]	A four-segment photodiode cantilever-bending sensor for an atomic-force microscope
	Instruments and Experimental Techniques, 2014

[7]	ChETYREKhSEGMENTNYI FOTODIODNYI DATChIK IZGIBA KANTILEVERA ATOMNO-SILOVOGO MIKROSKOPA
	DV Kazantsev, EA Kazantseva - Pribory i tekhnika eksperimenta, 2014, 2014

[8]	ЧЕТЫРЕХСЕГМЕНТНЫЙ ФОТОДИОДНЫЙ ДАТЧИК ИЗГИБА КАНТИЛЕВЕРА АТОМНО-СИЛОВОГО МИКРОСКОПА
	2014

[1]	Scattering-type apertureless scanning near-field optical microscopy Uspekhi Fizicheskih Nauk, 2024 DOI:10.3367/UFNr.2024.02.039652

[2]	Scattering-type apertureless scanning near-field optical microscopy Physics-Uspekhi, 2024 DOI:10.3367/UFNe.2024.02.039652

[3]	ASNOM mapping of SiC epilayer doping profile and of surface phonon polariton waveguiding Journal of Applied Physics, 2020 DOI:10.1063/1.5128104

[4]	Enhancement of the Local Electromagnetic Field over Planar “Particles” Formed on the Surface of a Polar Crystal JETP Letters, 2018 DOI:10.1134/S0021364018080106

[5]	Apertureless near-field optical microscopy Uspekhi Fizicheskih Nauk, 2017 DOI:10.3367/UFNr.2016.05.037817

[6]	Apertureless near-field optical microscopy Physics-Uspekhi, 2017 DOI:10.3367/UFNe.2016.05.037817

[7]	A four-segment photodiode cantilever-bending sensor for an atomic-force microscope Instruments and Experimental Techniques, 2014 DOI:10.1134/S0020441214040046

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