Natural Science

Natural Science

ISSN Print: 2150-4091
ISSN Online: 2150-4105
www.scirp.net/journal/ns
E-mail: [email protected]
"Effect of dislocation scattering on electron mobility in GaN"
written by R. Karthik, Uma Sathyakam P., P. S. Mallick,
published by Natural Science, Vol.3 No.9, 2011
has been cited by the following article(s):
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[3] Monitoring Current of a GaN HEMT at Ultra-High Magnetic Fields
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[4] Dark Current Analysis on GeSn pin Photodetectors
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[5] High-Purity Germanium Crystal Growth and Characterization for Underground Science
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[6] Clusters of Point Defects Near Dislocations as a Tool to Control CdZnTe Electrical Parameters by Ultrasound
Journal of Electronic Materials, 2018
[7] Optimum electronic structures for high thermoelectric figure of merit within several isotropic elastic scattering models
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[8] Investigation of Si and O Donor Impurities in Unintentionally Doped MBE-Grown GaN on SiC (0001) Substrate
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[9] 以電漿輔助分子束磊晶技術成長 III-族氮化物半導體之研究
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[10] The impact of neutral impurity concentration on charge drift mobility in p-type germanium
Journal of Instrumentation, 2016
[11] Mg Incorporation in GaN Grown by Plasma-Assisted Molecular Beam Epitaxy at High Temperatures
Journal of Crystal Growth, 2016
[12] SIMULASI DISTRIBUSI KONSENTRASI ELEKTRON KRISTAL SEMIKONDUKTOR GaAs PADA PERISTIWA DEFORMATION POTENTIAL SCATTERING BERBASIS METODE ELEMEN HINGGA
2016
[13] Study of Electron Transport in Semiconductor Materials
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[14] The impact of neutral impurity concentration on charge drift mobility in germanium
2016
[15] Simulasi Efek Hamburan Impuritas Terionisasi Terhadap Distribusi Pembawa Muatan Dioda Si pada Variasi Temperatur Operasional
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[16] Computer Software for Calculating Electron Mobility of Semiconductors Compounds; Case Study for N-Gan
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