Review of Modeling of Cracks in Silicon Photovoltaic Cells Using FEM and XFEM

Journal of Surface Engineered Materials and Advanced Technology

ISSN Print: 2161-4881
ISSN Online: 2161-489X
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"Review of Modeling of Cracks in Silicon Photovoltaic Cells Using FEM and XFEM"
written by Alain Ngenzi, Antoine Dieudonné Ndayisaba,
published by Journal of Surface Engineered Materials and Advanced Technology, Vol.16 No.3, 2026

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Journal of Surface Engineered Materials and Advanced Technology

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