has been cited by the following article(s):
|
[1]
|
Assessment of intrinsic and doped defects in Bridgman grown Cd1-xZnxTe alloys
Materials Science and Engineering: B,
2021
DOI:10.1016/j.mseb.2021.115160
|
|
|
|
|
[2]
|
Low noise and low power switched biased CSA with clocked reset and minimal PVT variation for APD based positron emission tomography
Analog Integrated Circuits and Signal Processing,
2016
DOI:10.1007/s10470-016-0767-4
|
|
|
|
|
[3]
|
Modeling and simulation of a hybrid 3D silicon detector system using SILVACO and Simulink/MATLAB framework
2016 28th International Conference on Microelectronics (ICM),
2016
DOI:10.1109/ICM.2016.7847919
|
|
|
|
|
[4]
|
Extended x-ray absorption fine structure and micro-Raman spectra of Bridgman grown Cd1−xZnxTe ternary alloys
Materials Research Express,
2014
DOI:10.1088/2053-1591/1/1/015018
|
|
|
|