Quantitative Evaluation of an Epitaxial Silicon-Germanium Layer on Silicon

ISSN Print: 2329-3306
ISSN Online: 2329-3314
www.scirp.net/journal/mr
E-mail: [email protected]

Citations

"Quantitative Evaluation of an Epitaxial Silicon-Germanium Layer on Silicon"
written by Jie-Yi Yao, Kun-Lin Lin, Chiung-Chih Hsu,
published by Microscopy Research, Vol.3 No.4, 2015

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[1]	B and Ga Co-Doped Si1−xGex for p-Type Source/Drain Contacts ECS Journal of Solid State Science and Technology, 2022 DOI:10.1149/2162-8777/ac546e