|
[1]
|
Large-Scale Facial Image Analysis and GWAS Unravel the Genetic Architecture of Facial Morphological Aging
Journal of Investigative Dermatology,
2026
DOI:10.1016/j.jid.2025.08.010
|
|
|
|
|
[2]
|
Detection Algorithm for Waveguide Connection and Probe Contact States Based on Machine Learning in Frequency Up to 1.1 Thz
2025 IEEE/MTT-S International Microwave Symposium - IMS 2025,
2025
DOI:10.1109/IMS40360.2025.11103894
|
|
|
|
|
[3]
|
On a Software Framework for Automated Pore Identification and Quantification for SEM Images of Metals
Computers,
2025
DOI:10.3390/computers14100442
|
|
|
|
|
[4]
|
Tilt-related alignment issues in miniature micromechanical on-wafer electrical probes composed of multiple flexible microcantilevers
Engineering Research Express,
2024
DOI:10.1088/2631-8695/ad2ccc
|
|
|
|
|
[5]
|
Hydrop enables droplet-based single-cell ATAC-seq and single-cell RNA-seq using dissolvable hydrogel beads
eLife,
2022
DOI:10.7554/eLife.73971
|
|
|
|
|
[6]
|
Long-Term Stability Test on On-Wafer Measurement System in Frequency Ranges up to 325 GHz
IEEE Transactions on Instrumentation and Measurement,
2021
DOI:10.1109/TIM.2020.3047486
|
|
|
|
|
[7]
|
Automatic probing system with machine learning algorithm
2021 96th ARFTG Microwave Measurement Conference (ARFTG),
2021
DOI:10.1109/ARFTG49670.2021.9425064
|
|
|
|
|
[8]
|
An Improved Template-Matching-Based Pose Tracking Method for Planar Nanopositioning Stages Using Enhanced Correlation Coefficient
IEEE Sensors Journal,
2020
DOI:10.1109/JSEN.2020.2977370
|
|
|
|
|
[9]
|
Uncertainty Analysis Method Including Influence of Probe Alignment on On-Wafer Calibration Process
IEEE Transactions on Instrumentation and Measurement,
2019
DOI:10.1109/TIM.2019.2907733
|
|
|
|
|
[10]
|
Multi-target tracking for automated RF on-wafer probing based on template matching
2019 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS),
2019
DOI:10.1109/MARSS.2019.8860983
|
|
|
|
|
[11]
|
Demonstration of Improvement of Repeatability in Thru-Reflect-Line Calibration Using Precision Probing Technique
2018 48th European Microwave Conference (EuMC),
2018
DOI:10.23919/EuMC.2018.8541773
|
|
|
|
|
[12]
|
Realization of Accurate On-Wafer Measurement Using Precision Probing Technique at Millimeter-Wave Frequency
IEEE Transactions on Instrumentation and Measurement,
2018
DOI:10.1109/TIM.2018.2806058
|
|
|
|
|
[13]
|
Accuracy Improvement of On-wafer Measurement at Millimeter-wave Frequency by a Full-automatic RF probe-tip Alignment Technique
2018 91st ARFTG Microwave Measurement Conference (ARFTG),
2018
DOI:10.1109/ARFTG.2018.8423825
|
|
|
|
|
[14]
|
RF wafer probing with improved contact repeatability using nanometer positioning
2016 87th ARFTG Microwave Measurement Conference (ARFTG),
2016
DOI:10.1109/ARFTG.2016.7501967
|
|
|
|
|
[15]
|
Simulation of probe misalignment effects during RF on-wafer probing
2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz),
2016
DOI:10.1109/IRMMW-THz.2016.7758851
|
|
|
|