Study on Test Compaction in High-Level Automatic Test Pattern Generation (ATPG) Platform

ISSN Print: 2153-1285
ISSN Online: 2153-1293
www.scirp.net/journal/cs
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Citations

"Study on Test Compaction in High-Level Automatic Test Pattern Generation (ATPG) Platform"
written by Ayub Chin Abdullah, Chia Yee Ooi,
published by Circuits and Systems, Vol.4 No.4, 2013

has been cited by the following article(s):

[1]	Development, Verification and Analysis of a Fault Injection Tool for Improving Dependability of FPGA Systems
	2019

[2]	ATPG Method with a Hybrid Compaction Technique for Combinational Digital Systems
	2016

[3]	基于人工蜂群算法的数字电路多故障测试生成算法
	重型机械, 2016

[1]	ATPG method with a hybrid compaction technique for combinational digital systems 2016 SAI Computing Conference (SAI), 2016 DOI:10.1109/SAI.2016.7556091