Experimental Measurement of Minority Carriers Effective Lifetime in Silicon Solar Cell Using Open Circuit Voltage Decay under Magnetic Field in Transient Mode

ISSN Print: 2151-481X
ISSN Online: 2151-4844
www.scirp.net/journal/sgre
E-mail: [email protected]

Citations

"Experimental Measurement of Minority Carriers Effective Lifetime in Silicon Solar Cell Using Open Circuit Voltage Decay under Magnetic Field in Transient Mode"
written by Alain Diasso, Raguilignaba Sam, Bernard Zouma, François Zougmoré,
published by Smart Grid and Renewable Energy, Vol.11 No.11, 2020

has been cited by the following article(s):

[1]	Theoretical and experimental studies of effective carriers lifetime: Magnetic effects
	2021

[1]	Theoretical study of the solution of the diffusion equation under effect of the magnetic field on the silicon solar cell Multidiscipline Modeling in Materials and Structures, 2025 DOI:10.1108/MMMS-06-2024-0175

[2]	A simple and effective carrier lifetime characterization for semiconductor thin films Journal of Semiconductors, 2025 DOI:10.1088/1674-4926/24090005

[3]	Theoretical and experimental studies of effective carriers lifetime: Magnetic effects International Journal of Physical Sciences, 2021 DOI:10.5897/IJPS2021.4970