New Method of Determining the Landau Levels in Narrow-Gap Semiconductors

Open Journal of Applied Sciences

ISSN Print: 2165-3917
ISSN Online: 2165-3925
www.scirp.net/journal/ojapps
E-mail: [email protected]

Citations

"New Method of Determining the Landau Levels in Narrow-Gap Semiconductors"
written by G. Gulyamov, U. I. Erkaboev, G. N. Majidova, M. O. Qosimova, A. B. Davlatov,
published by Open Journal of Applied Sciences, Vol.5 No.12, 2015

has been cited by the following article(s):

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