• Wave Propagation in Nanocomposite Materials ()
  Pierre Hillion
  Journal of Electromagnetic Analysis and Applications Vol.2 No.7,  July 30, 2010
  DOI: 10.4236/jemaa.2010.27053  5,826 Downloads   10,331 Views   Citations
  This article belongs to the Special Issue on

• Analysis of Double and Single Sided Induction Heating Systems by Layer Theory Approach ()
  Layth Jameel Buni Qaseer
  Journal of Electromagnetic Analysis and Applications Vol.2 No.7,  July 30, 2010
  DOI: 10.4236/jemaa.2010.27052  5,052 Downloads   9,980 Views   Citations
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• Voltage Generation by Rotating an Arbitrary-Shaped Metal Loop around Arbitrary Axis in the Presence of an Axial Current Distribution ()
  Constantinos A. Valagiannopoulos
  Journal of Electromagnetic Analysis and Applications Vol.2 No.6,  July 1, 2010
  DOI: 10.4236/jemaa.2010.26051  4,507 Downloads   8,068 Views   Citations
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• Far Infrared Ray Radiation Inhibits the Proliferation of A549, HSC3 and Sa3 Cancer Cells through Enhancing the Expression of ATF3 Gene ()
  Kikuji Yamashita, Shine-Od Dalkhsuren, Tatsuo Ishikawa, Kaori Sumida, Jun Ishibashi, Hiroyoshi Hosokawa, Akemichi Ueno, Fumio Nasu, Seiichiro Kitamura
  Journal of Electromagnetic Analysis and Applications Vol.2 No.6,  July 1, 2010
  DOI: 10.4236/jemaa.2010.26050  5,749 Downloads   11,592 Views   Citations
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• Effect of Zn Substitution on the Magnetic Properties of Cobalt Ferrite Nano Particles Prepared Via Sol-Gel Route ()
  Sonal Singhal, Tsering Namgyal, S. Bansal, Kailash Chandra
  Journal of Electromagnetic Analysis and Applications Vol.2 No.6,  July 1, 2010
  DOI: 10.4236/jemaa.2010.26049  12,335 Downloads   24,787 Views   Citations
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• Measurement and Analysis of Temperature Dependent Resistance of La0.67Ca/Sr0.33MnO3 CMR Samples Using LabVIEW ()
  Sunita Keshri, Leena Joshi, Sanat Kumar Mukherjee, V. F. Kraǐdenov
  Journal of Electromagnetic Analysis and Applications Vol.2 No.6,  July 1, 2010
  DOI: 10.4236/jemaa.2010.26048  6,350 Downloads   11,763 Views   Citations
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• Optical Constants for MBE n-Type GaAs Films Doped by Si or Te between 1.50-4.75 eV ()
  Svetlana N. Svitasheva
  Journal of Electromagnetic Analysis and Applications Vol.2 No.6,  June 30, 2010
  DOI: 10.4236/jemaa.2010.26046  7,610 Downloads   13,803 Views   Citations
  This article belongs to the Special Issue on