Prof. Chun-Hu
Cheng
Deptartment of
Mechatronic Technology
National Taiwan
Normal University, Chinese Taipei
E-mail: [email protected]
Qualifications
Double Ph.D.,
Electronics and Mechanical Engineering
Ph.D.,
Electronics Engineering, National Tsing Hua University
Ph.D., Mechanical
Engineering, National Chiao Tung University
Publications (Selected)
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Kannadassan, D., Sivasankaran, K., Kumaravel, S., Cheng, C. H., Baghini, M. S., & Mallick, P. S. (2024). High-$ k $ Metal–Insulator–Metal Capacitors for RF and Mixed-Signal VLSI Circuits: Challenges and Opportunities. Proceedings of the IEEE.
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Liao, R. Y., Chen, H. H., Lin, P. Y., Liang, T. A., Su, K. H., Lin, I. C., ... & Cheng, C. H. (2023). Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices. Materials, 16(9), 3306.
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Liu, C. B., Liao, R. Y., Chen, H. H., Zheng, Z. W., Su, K. H., Lin, I. C., ... & Huang, C. C. (2024). Ferroelectric memory devices using hafnium aluminum oxides and remote plasma-treated electrodes for sustainable energy-efficient electronics. Materials Research Express, 11(4), 046404.
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Chen, H. H., Liao, R. Y., Chou, W. C., Hsu, H. H., Cheng, C. H., & Huang, C. C. (2022). Ferroelectric polarization enhancement in hafnium-based oxides through capping layer engineering. IEEE Journal of the Electron Devices Society, 10, 947-952.
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Cheng, C. H., Chen, W. T., Lin, K. H., Chen, H. H., Liao, R. Y., Huang, C. C., ... & Hsu, H. H. (2022). Temperature-dependent polarization switching and endurance cycling properties of HfAlO ferroelectric thin film. ECS Journal of Solid State Science and Technology, 11(8), 083013.
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Chang, J. H., Zheng, C. G., Chen, H. H., Chen, P. T., Liu, C. B., Huang, K. Y., ... & Han, S. T. (2022). Effect of capping layer on the ferroelectricity of hafnium oxide. Thin Solid Films, 753, 139274.
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He, G. Y., Li, M. H., Liu, W. D., Ying, L. Y., Zhang, B. P., Zheng, Z. W., & Cheng, C. H. (2021). Simultaneous analysis of multi-variables effect on the performance of multi-domain MFIS negative capacitance field-effect transistors. IEEE Journal of the Electron Devices Society, 9, 741-747.
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Shang, Z. W., Xu, Q., He, G. Y., Zheng, Z. W., & Cheng, C. H. (2021). Effect of plasma oxidation on tin-oxide active layer for thin-film transistor applications. Journal of Materials Science, 56(10), 6286-6291.
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Hsu, H. H., Liu, H. M., Lee, S., & Cheng, C. H. (2021). Impact of stress and doping effects on the polarization behavior and electrical characteristics of hafnium–zirconium oxides. Ceramics International, 47(2), 2864-2868.
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Huang, C. C., Mo, C. C., Hsiao, T. H., Chen, G. M., Lu, S. H., Tai, Y. H., ... & Cheng, C. H. (2020). Preparation and magnetic properties of high performance Ca–Sr based M-type hexagonal ferrites. Results in Materials, 8, 100150.
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Rajshekar, K., Hsu, H. H., Kumar, K. U. M., Sathyanarayanan, P., Velmurugan, V., Cheng, C. H., & Kannadassan, D. (2020). physical modeling of p-type fluorinated Al-doped tin-oxide thin film transistors. IEEE Journal of the Electron Devices Society, 8, 948-958.
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Shang, Z. W., Hsu, H. H., Zheng, Z. W., & Cheng, C. H. (2019). Progress and challenges in p-type oxide-based thin film transistors. Nanotechnology Reviews, 8(1), 422-443.
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Cheng, C. H., Chin, A., & Hsu, H. H. (2019). Forming-Free SiGeO x/TiO y Resistive Random Access Memories Featuring Large Current Distribution Windows. Journal of Nanoscience and Nanotechnology, 19(12), 7916-7919.
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Liu, C., Tung, Y. C., Tseng, C. Y., Wang, W. C., Chen, H. H., Lee, T. M., ... & Hsu, H. H. (2019). Stabilizing ferroelectric domain switching of hafnium aluminum oxide using metal nitride electrode engineering. ECS Journal of Solid State Science and Technology, 8(10), P553.
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Chang, T. J., Liu, C., Fan, C. C., Hsu, H. H., Chen, H. H., Chen, W. H., ... & Chang, C. Y. (2019). Investigation on polarization characteristics of ferroelectric memories with thermally stable hafnium aluminum oxides. Vacuum, 166, 11-14.
Profile Details
https://orcid.org/0000-0002-7995-4725
https://scholar.lib.ntnu.edu.tw/en/persons/chun-hu-cheng
https://scholar.google.com/citations?user=dQjV_moAAAAJ&hl=en
https://www.researchgate.net/profile/Cheng-Chun-Hu