2008 Ph.D., Electrical and Electronic Engg., The University of Hong Kong, China
2004 M.Phil., Electrical & Electronic Engg., The University of Hong Kong, China
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H.Y.T. Ngan, G.K.H. Pang and N.H.C. Yung, “Automated Fabric Defect Detection – A Review,” Image and Vision Computing, vol. 29, no. 7, pp. 442-458, 2011.
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H.Y.T. Ngan, G.K.H. Pang and N.H.C. Yung, “Ellipsoidal Decision Regions for Motif-based Patterned Fabric Defect Detection,” Pattern Recognition, vol. 43, no. 6, pp. 2132-2144, 2010.
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H.Y.T. Ngan, and G.K.H. Pang, “Regularity Analysis for Patterned Texture Inspection,” IEEE Trans. Automation Science & Engineering, vol. 6, no. 1, pp. 131-144, 2009.
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H.Y.T. Ngan, G.K.H. Pang and N.H.C. Yung, “Motif-based Defect Detection for Patterned Fabric,” Pattern Recognition, vol. 41, issue 6, pp. 1878-1894, 2008.
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H.Y.T. Ngan, G.K.H. Pang and N.H.C. Yung, “Performance Evaluation for Motif-based Patterned Texture Defect Detection,” IEEE Trans. Automation Science & Engineering, 7(1), pp. 58-72, 2010.
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H.Y.T. Ngan, and G.K.H. Pang, “Novel Method for Patterned Fabric Inspection using Bollinger Bands,” Optical Engineering, vol. 45, no. 8, 2006.
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H.Y.T. Ngan, G.K.H. Pang, S.P. Yung, and M.K. Ng, “Wavelet based methods on Patterned Fabric Defect Detection,” Pattern Recognition, vol. 38, issue 4, pp. 559-576, 2005.
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H.Y.T. Ngan, G.K.H. Pang, N.H.C. Yung, “Patterned Fabric Defect Detection Using A Motif-based Approach,” Proc. IEEE Int’l Conf. on Image Processing (ICIP2007), vol.2, pp. II-33-II-36, 2007.
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H.Y.T. Ngan, N.H.C. Yung, and A.G.O. Yeh, “Modeling of Traffic Data based by Dirichlet Process Mixtures,” 8th IEEE Int’l Conf. Automation Science & Engineering (CASE) 2012, pp. 224-229, 2012.